The semiconductor industry demands the highest precision and quality control. Our comprehensive suite of analytical instruments provides critical insights at every stage of chip manufacturing, from wafer inspection to failure analysis. We help you maintain yield, ensure quality, and accelerate innovation in an increasingly complex technological landscape.
High-resolution SEM and optical microscopy for defect detection and pattern inspection at nanometer scale
XRD, XRF, and spectroscopy solutions for composition and crystal structure analysis
Advanced imaging and analytical tools to identify failure mechanisms and improve yields
Real-time analytical systems for in-line quality control and process optimization
Solution: Ultra-high resolution SEM with advanced detectors for atomic-scale defect identification
Solution: Cross-sectional SEM and TEM with EDS/EELS for complete layer-by-layer characterization
Solution: Automated workflows and AI-assisted analysis for rapid root cause identification
15% yield increase through enhanced defect detection and classification
40% reduction in failure analysis turnaround time with automated imaging
Let our experts help you find the perfect solution for your semiconductor applications.