Scanning Electron Microscope (SEM)

Our state-of-the-art Scanning Electron Microscope offers unparalleled resolution and imaging capabilities for surface analysis. Perfect for materials science, semiconductor inspection, and biological research. Features advanced detectors and automated workflows for efficient high-throughput analysis.

✨Key Features

Resolution down to 1nm

Variable pressure mode

Automated image acquisition

EDS integration ready

User-friendly interface

Multiple detector options

⚙️Technical Specifications

Resolution

1.0 nm @ 15kV

Magnification

10x to 1,000,000x

Acceleration Voltage

0.2 - 30 kV

Chamber Size

300mm diameter

Sample Size

Up to 200mm

Detectors

SE, BSE, STEM

🎯Applications

Materials characterizationSemiconductor inspectionFailure analysisQuality controlResearch and developmentBiological imaging

Industries Served

Semiconductor

Materials Science

Automotive

Electronics

Life Sciences

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