Home/Products/Atomic Force Microscope (AFM)
🔬
Electron Microscopy

Atomic Force Microscope (AFM)

Versatile AFM systems for topography, mechanical, and electrical characterization at the nanoscale. Suitable for a wide range of samples from soft biological specimens to hard materials. Features multiple imaging modes and advanced automation.

Key Features

Atomic resolution
Multiple imaging modes
Liquid environment
Automated operation
Force spectroscopy
Temperature control

⚙️Technical Specifications

Resolution
<1 nm lateral
Scan Range
100 x 100 μm
Z Range
15 μm
Modes
Contact, Tapping, EFM, MFM
Environment
Air, liquid, vacuum

🎯Applications

Surface topographyNanomechanicsThin film analysisPolymer researchBiological imaging

Industries Served

Nanotechnology
Materials Science
Life Sciences
Semiconductor

Downloads

Need Assistance?

Our product specialists are here to help you find the right solution.