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Electron Microscopy

Atomic Force Microscope (AFM)

Versatile AFM systems for topography, mechanical, and electrical characterization at the nanoscale. Suitable for a wide range of samples from soft biological specimens to hard materials. Features multiple imaging modes and advanced automation.

✨Key Features

Atomic resolution
Multiple imaging modes
Liquid environment
Automated operation
Force spectroscopy
Temperature control

⚙️Technical Specifications

Resolution
<1 nm lateral
Scan Range
100 x 100 μm
Z Range
15 μm
Modes
Contact, Tapping, EFM, MFM
Environment
Air, liquid, vacuum

🎯Applications

Surface topographyNanomechanicsThin film analysisPolymer researchBiological imaging

Industries Served

Nanotechnology
Materials Science
Life Sciences
Semiconductor

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